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Project S3 - High resolution nanomechanics measurements using AFM
The aim of this project is to develop measurement methods in order to resolve quantification issues using atomic force microscopy (AFM) to optimise operating conditions, improve reproducibility and additionally of the measurements.
The objectives of the project are:
- To provide traceable calibration of lateral force in AFM for the first time.
- To develop a method to calibrate AFM tip shape and provide a procedure.
- To evaluate the imaging capabilities, resolution and durability of carbon nanotube AFM tips.
- To improve the reproducibility and consistency of normal force and modulus measurement at the nano-scale via an interlaboratory study.
- To optimise operating conditions for force modulation microscopy and phase imaging.
- To develop methods for depth profiling using AFM.
- Publication of a paper entitled ‘Nanoindentation measurement of Young's modulus for compliant layers on stiffer substrates including the effect of Poisson's ratios’.
Further information can be obtained by contacting the NMS helpdesk at LGC.
Last modified on
07 March 2012.