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Surface and nano-analysis - An overview
The aims of this theme are:
- To support innovation and competitiveness through the development of reliable leading-edge measurement.
- To develop, strategically, the measurement capabilities and infrastructure to meet the needs of knowledge-based industries and for quality of life.
- To ensure that UK measurements are fit-for-purpose, provide international comparability of measurements and ensure that the measurement infrastructure is in place to underpin systems for accreditation and quality control.
- To provide leadership in frontier issues in surface and nano-analysis measurement in the UK and internationally.
- To conduct key knowledge transfer activities including national and international comparisons, representation on international bodies to ensure international uniformity and traceability of UK measurements and to ensure that knowledge outputs are promulgated effectively and impact the key audiences.
Project S1 - Quantitative analysis of surfaces with sub-micron topography - Aims to investigate and resolve quantitative issues on the effects of surface topography for three principal industry techniques: XPS, SIMS and AFM.
Project S2 - Development of quantitative analysis methods for compounds and multilayer structures - Aims to develop valid methods for industrial analysis by XPS and SIMS for inorganic and organic coatings and the development of a standards infrastructure.
Project S3 - High resolution nanomechanics measurements using AFM - Aims to develop measurement methods in order to resolve quantification issues using AFM to optimise operating conditions and improve reproducibility of measurements.
Project S4 - Ambient and imaging mass spectrometry - To begin the establishment of a metrology infrastructure for Desorption Electrospray Surface Ionisation (DESI) and related ambient mass spectrometry techniques.
For further information on any of the projects please click on the relevant link.
Last modified on
07 March 2012.